Electron Microscopy Laboratory

The University of British Columbia, Vancouver, British Columbia
What the facility does

Advanced materials characterization across micro- and nanoscale for academic and industrial research.

Areas of expertise

The Electron Microscopy Laboratory in the Department of Materials Engineering at the University of British Columbia is a premier shared research facility offering world-class expertise in advanced materials characterization across length scales from microns to nanometers. The lab provides unique, high-throughput, automation-enabled analytical capabilities for a wide range of materials science applications.

Core expertise includes high-resolution scanning electron microscopy (SEM, used for characterizing materials at nanometer resolution) and focused ion beam-scanning electron microscopy (FIB-SEM, combines SEM imaging with ion milling for site-specific sample preparation and analysis) imaging, automated high-volume characterization, electron backscatter diffraction (EBSD, determines crystallographic orientation and phase information) and energy dispersive X-ray spectroscopy (EDS, identifies elemental composition) microanalysis, site-specific sample preparation, 3D microstructural reconstruction, and correlative materials analysis. Flagship platforms include the robot-enhanced Thermo Fisher Apreo 2 ChemiSEM and the TESCAN AMBER-X Xe-plasma FIB-SEM, enabling rapid, statistically relevant materials studies. Complementary expertise in X‑ray diffraction (XRD), microhardness testing, optical microscopy, and advanced sample preparation ensures fully integrated workflows.

The facility supports academic, industrial, and international users through both expert staff-led analysis and comprehensive user training.

Research services

The Electron Microscopy Laboratory provides comprehensive materials characterization services to academic, industrial, government, and non-profit users. Services are delivered through a combination of staff-assisted analysis, collaborative research, and user training, and include:
 

  • Scanning Electron Microscopy (SEM) imaging and analysis: High-resolution imaging using multiple platforms, including field-emission, tungsten-filament, tabletop, and robot-enhanced SEM systems.
  • Focused Ion Beam (FIB-SEM): Site-specific cross-sectioning, nanofabrication, 3D serial sectioning, and microstructural reconstruction using both Gallium Focused Ion Beam (Ga-FIB) and Xenon Plasma Focused Ion Beam (Xe-plasma FIB) systems.
  • High-throughput and automated characterization: Automated SEM-based analysis for large sample sets using the robotic Apreo 2 ChemiSEM System.
  • Microanalysis Energy Dispersive X-ray Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD): Elemental composition, phase identification, and crystallographic orientation mapping for metals, ceramics, semiconductors, and composites.
  • Advanced sample preparation: Mechanical, ion-beam, and site-specific FIB lift-out preparation for SEM, STEM, and surface analysis.
  • X-ray diffraction (XRD): Phase identification, texture, and crystallographic analysis using a D6 Phaser tabletop diffractometer.
  • Mechanical and optical characterization: Microhardness testing and optical microscopy for correlative materials analysis.
  • Training and access programs: User training, certification, and technician-supported research for safe and reproducible experimentation.
  • Collaborative research and industrial problem solving: Support for materials development, failure analysis, advanced manufacturing, energy materials, and net-zero technologies.
Sectors of application
  • Clean technology
  • Defence and security industries
  • Energy
  • Manufacturing and processing
  • Mining, minerals and metals
  • Electron microscopy: Scanning Electron Microscopes (SEM), Scanning Transmission Electron Microscope (STEM) and Gallium Focused Ion Beam–SEM (Ga FIB-SEM) Systems.
  • Optical microscopy and imaging: Suite with brightfield and digital microscopes for correlative imaging and field emission gun scanning electron microscope (FEG-SEM) for analytical imaging.
  • Sample preparation: Tools for cutting, polishing, coating, and preparing samples for FIB, SEM, and TEM; vacuum coaters (sputter/evaporation); robot-enhanced SEM automation system with robotic loading for automated SEM preparation and batch analysis.
  • Microanalysis: Energy dispersive X-ray spectroscopy for elemental analysis (EDS Systems) and electron backscatter diffraction for crystallographic analysis (EBSD Systems). Analytical workstations for data processing (SEM/FIB/TEM/XRD analysis).
  • Surface and structural analysis: High-resolution chemical and compositional surface analysis (X-ray Photoelectron Spectroscopy (XPS) System); X-ray diffractometer for phase identification and crystallographic analysis.
  • Advanced materials characterization: Tools supporting integrated analysis including indentation-based hardness and mechanical property testing (microhardness tester).
  • Collaboration spaces: Space for research meetings, consultations, training, and collaborative work.