Advanced Microscopy and Materials Characterization Facility - GLIER

Scanning Electron Microscope Lab

FEI Quanta 200 FEG Environmental SEM

• Field Emission Gun-Scanning Electron Microscope (FEG-SEM) with high vacuum, low vacuum and environmental mode. Field Emission Filament. Backscatter, secondary and combined images viewed simultaneously. 
• Variable Pressure SEM with low vacuum and Environmental SEM capabilities. Equipped with Energy Dispersive Spectroscopy (EDS) capabilities.

• Resolution to 5 nm.
• Scandium measuring software.

Everhart-Thornley Secondary Electron (SE) detector

For High Vacuum Imaging

Large field Secondary Electron (SE) detector

For Low Vacuum Imaging

Gaseous Secondary Electron (SE) detector

For Environmental Mode Imaging

Back Scatter Electron Detector (BSE)

For Compositional Differences Imaging

Cathodoluminescence Detector

For Trace Element Imaging

EDAX Octane Plus SDD X-Ray Detector (EDS)

• High Resolution Silicon Drift X-Ray Detector with excellent light element detection for elemental analysis of all elements but H, He and Li.
• EDS mapping, point analysis or linescan.
• Large, multi-field mapping capabilities.
• Fast processing for quick mapping.

Leica ACE 600 Carbon Coater

• Provides conductive carbon coating to non-conductive samples for viewing in high vacuum in the SEM.
• Uses carbon thread.

Raman Spectrometer/Atomic Force Microscope Lab

WITec Raman Spectrometer

• Raman spectrometer measures vibrational energy of chemical bonds to determine chemical identity of molecules or compounds.
• Confocal Raman imaging (maps), point analysis, line scans and 3D depth scan capabilities.
• 532 nm and 785 nm lasers for Raman.

Atomic Force Microscope (AFM)

Provides nanometer scale imaging of surface topography and surface information.

True Surface Profilometer

Provides surface topography to guide focus during Raman imaging on rough or sloped surfaces.

SNOM equipment

Scanning Near-Field Optical Microscopy (SNOM) provides nanometer-scale optical imaging.

Wiley KnowItAll databases and search-match software

Search-match software and databases to identify Raman spectra generated.

Fluorescence Microscope/Light Microscope

Leica DM LA epifluorescence/light microscope

Light and epifluorescence microscope with camera using:

• Improvision software
• Brightfield (BF) optical microscope, phase contrast, 5x, 10x, 20x, 40x, 3x(oil) lenses
• Epifluorescence filters: A4 (UV-λ360), GFP (blue-λ470) N2.1 (green-λ515-560)